Reliability of 3D NAND flash memory with a focus on read voltage calibration from a system aspect.
Nikolaos PapandreouNikolas IoannouThomas P. ParnellRoman A. PletkaMilos StanisavljevicRadu StoicaSasa TomicHaralampos PozidisPublished in: NVMTS (2019)
Keyphrases
- flash memory
- read write
- disk drives
- hard disk
- garbage collection
- file system
- solid state
- random access
- buffer management
- main memory
- embedded systems
- data storage
- database systems
- b tree
- storage medium
- camera calibration
- storage devices
- storage systems
- hand held devices
- personal computer
- power system
- database management systems
- data management
- databases
- transmission line
- memory management
- management system
- query processing
- data analysis
- case study