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A MEMS accelerometer with double-sided symmetrical folded-beams on single wafer.

Wei LiXiaofeng ZhouJian WuYouling LinZe WangLu feng Che
Published in: NEMS (2017)
Keyphrases
  • special case
  • neural network
  • genetic algorithm
  • expert systems
  • databases
  • real world
  • learning algorithm
  • evolutionary algorithm
  • semiconductor manufacturing