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Length Bias in the Measurements of Carbon Nanotubes.
Paul H. Kvam
Published in:
Technometrics (2008)
Keyphrases
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carbon nanotubes
image processing
measurement noise
fixed length
noisy measurements
minimum length
sensor measurements
measurement error
artificial neural networks
wide range
website
wireless sensor networks
real world
measured data
variance reduction
trade off
image segmentation
minimal length
computer vision