Characterizing the Worst-Case Wafer Delay in a Cluster Tool Operated in a $K$-Cyclic Schedule.

Dong-Hyun Roh Tae-Eog Lee

Published in: CASE (2018)

Keyphrases

worst case
critical path
np hard
greedy algorithm
average case
scheduling problem
data clustering
integrated circuit
real time
neural network
learning algorithm
pairwise
upper bound
cluster analysis
hierarchical clustering