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Information-Rich Manufacturing Metrology.

Richard K. LeachPatrick BointonXiaobing FengSimon LawesSamanta PianoNicola SeninDanny Sims-WaterhousePetros StavroulakisRong SuWahyudin P. SyamMatthew Thomas
Published in: IPAS (2018)
Keyphrases
  • domain knowledge
  • information processing
  • prior knowledge
  • spatial information
  • real world
  • artificial intelligence
  • information systems
  • high level
  • relational databases
  • higher level
  • user interaction