Sign in

Feature Selection of Frequency Spectrum for Modeling Difficulty to Measure Process Parameters.

Jian TangLijie ZhaoYi-miao LiTianyou ChaiSi-Zhao Joe Qin
Published in: ISNN (2) (2012)
Keyphrases
  • feature selection
  • frequency spectrum
  • feature space
  • image analysis
  • similarity measure
  • classification accuracy
  • parameter estimation