Numerical modeling of MOS transistor with interconnections using lumped element-FDTD method.
Samir LabiodSaïda LatrecheChristian GontrandPublished in: Microelectron. J. (2012)
Keyphrases
- sensitivity analysis
- high accuracy
- preprocessing
- experimental evaluation
- detection method
- objective function
- significant improvement
- cost function
- dynamic programming
- similarity measure
- computationally efficient
- optimization method
- computational cost
- fully automatic
- image segmentation
- modeling method
- high precision
- segmentation method
- synthetic data
- model selection
- support vector machine
- artificial neural networks
- computational complexity