Measurement System for Characterization of a Resistor Array in 180-nm CMOS Technology.
Ivana FrankovicFranjo MikicJosip MikulicNiko BakoGregor SchatzbergerAdrijan BaricPublished in: MIPRO (2023)
Keyphrases
- cmos technology
- image sensor
- low power
- power consumption
- low voltage
- spl times
- parallel processing
- silicon on insulator
- power dissipation
- dynamic range
- random access memory
- mixed signal
- low cost
- solid state
- video camera
- pattern recognition
- hardware and software
- digital camera
- imaging systems
- image processing algorithms