A 360-fs-Time-Resolution 7-bit Stochastic Time-to-Digital Converter With Linearity Calibration Using Dual Time Offset Arbiters in 65-nm CMOS.
Hayun ChungMinji HyunJungwon KimPublished in: IEEE J. Solid State Circuits (2021)
Keyphrases
- analog to digital converter
- cmos image sensor
- low power
- image sensor
- metal oxide semiconductor
- cmos technology
- camera calibration
- mixed signal
- data conversion
- low voltage
- feature selection
- circuit design
- nm technology
- solid state
- random access memory
- high speed
- geometric properties
- control method
- multi view
- neural network