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Improvement of Resonance Characteristics by Post-Annealing in FBAR Devices.
Jae-Young Lee
Linh Mai
Gi-Wan Yoon
Published in:
J. Inform. and Commun. Convergence Engineering (2007)
Keyphrases
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simulated annealing
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artificial intelligence
database systems
hidden markov models
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monte carlo
key features
electronic devices