Testing with Large Parameter Sets for the Development of Embedded Systems in the Automation Domain.
Florian KantzThomas RuschivalPhilipp NenningerDetlef StreitferdtPublished in: COMPSAC (2) (2009)
Keyphrases
- embedded systems
- embedded software
- embedded real time systems
- safety critical
- resource limited
- computing power
- communication technologies
- low cost
- real time systems
- embedded devices
- real time image processing
- software systems
- development projects
- processing power
- software architecture
- software testing
- field programmable gate array
- petri net
- hw sw
- software engineering
- flash memory
- consumer electronics