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A Measurement Study on the (In)security of End-of-Life (EoL) Embedded Devices.
Dingding Wang
Muhui Jiang
Rui Chang
Yajin Zhou
Baolei Hou
Xiapu Luo
Lei Wu
Kui Ren
Published in:
CoRR (2021)
Keyphrases
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embedded devices
data sets
low cost
multi dimensional
information security