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Identification of Defective CMOS Devices Using Correlation and Regression Analysis of Frequency Domain Transient Signal Data.
James F. Plusquellic
Donald M. Chiarulli
Steven P. Levitan
Published in:
ITC (1997)
Keyphrases
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frequency domain
regression analysis
correlation analysis
fourier transform
cross correlation
spatial domain
image data
low pass
explanatory variables
infrared
missing data
subband
statistical analysis
factor analysis
signal processing
denoising
feature extraction
frequency response
interval valued data