Resilience, Production Yield and Self-Configuration in the Future Massively Defective Nanochips.

Jacques Henri Collet Piotr Zajac

Published in: IOLTS (2007)

Keyphrases

long term
massively parallel
neural network
data sets
real world
data mining
multiscale
video sequences
wireless sensor networks
scheduling problem
production system
parallel computing
production planning
predicting future
network configuration