Machine Learning in Nanometer AMS Design-for-Reliability : (Invited Paper).
Tinghuan ChenQi SunBei YuPublished in: ASICON (2021)
Keyphrases
- machine learning
- invited paper
- pattern recognition
- support vector machine
- artificial neural networks
- natural language processing
- design process
- real world
- learning algorithm
- artificial intelligence
- reinforcement learning
- active learning
- knowledge discovery
- text mining
- machine learning methods
- knowledge engineering