Interactive overlay maps for US patent (USPTO) data based on International Patent Classification (IPC).
Loet LeydesdorffDuncan KushnirIsmael RàfolsPublished in: Scientometrics (2014)
Keyphrases
- data sets
- database
- data processing
- training data
- data analysis
- synthetic data
- statistical analysis
- data collection
- spatial data
- knowledge discovery
- data sources
- data visualization
- information retrieval
- classification accuracy
- text classification
- high quality
- original data
- classification models
- classification method
- intellectual property
- data mining techniques
- support vector machine
- probability distribution
- end users
- feature space
- data structure