The Scanning Electron Microscope (SEM) Assessment System Using The Autoregressive (AR) Technique.

Hean-Teik Chuah Nidal S. Kamel Kok-Swee Sim

Published in: VISION (2005)

Keyphrases

autoregressive
scanning electron microscope
augmented reality
non stationary
moving average
gaussian markov random field
random fields
random field models
sar images
spectrum analysis
autoregressive model
computer vision
maximum entropy
higher order
wavelet transform
prior knowledge
image segmentation