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Noise Immunity and its Temperature Characteristics Study of the Capacitive-Loaded Level Shift Circuit for High Voltage Gate Drive IC.

Jing ZhuYunwu ZhangWeifeng SunYangyang LuLongxing ShiYan GuSen Zhang
Published in: IEEE Trans. Ind. Electron. (2018)
Keyphrases
  • high voltage
  • noise immunity
  • information retrieval
  • multiscale
  • object recognition
  • high order