Rapid Grading of Mangosteen Peel Defect Using Extreme Learning Machine.
Mohamad Imam AfandiEdi KurniawanSastra Kusuma WijayaPublished in: IC3INA (2021)
Keyphrases
- extreme learning machine
- support vector regression
- feed forward neural networks
- feedforward neural networks
- neural network
- hidden nodes
- gaussian processes
- single layer
- activation function
- variable selection
- support vector machine
- back propagation
- pattern recognition
- hidden layer
- multi layer
- recurrent neural networks
- model selection
- expert systems