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Evolution of automatic semiconductor test equipment: automatic test pattern learning, classification, optimisation and generation for power supply noise.

Eric LiauDoris Schmitt-Landsiedel
Published in: VECIMS (2003)
Keyphrases
  • power supply
  • feature extraction
  • genetic algorithm
  • decision trees
  • neural network
  • machine learning
  • support vector
  • pattern recognition
  • support vector machine svm