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Critical Charge Characterization for Soft Error Rate Modeling in 90nm SRAM.

Riaz NaseerYounes BoulghassoulJeff DraperSandeepan DasGuptaArt Witulski
Published in: ISCAS (2007)
Keyphrases
  • error rate
  • test set
  • lower error rates
  • rule sets
  • data transmission
  • false discovery rate
  • objective function
  • multi class
  • text entry
  • misclassification rate