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Hurdle model with random effects for the study of copper hillocks growth in integrated circuits manufacturing.

Guilin LiRoyston TanSzu Hui NgDaniel Chua
Published in: IEEM (2015)
Keyphrases
  • integrated circuit
  • random effects
  • computer vision
  • feature extraction
  • image features
  • multiscale
  • linear regression
  • mixed effects