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Distortion Analysis Using Volterra Series and Linearization Technique of Nano-Scale Bulk-Driven CMOS RF Amplifier.

Haoran YuKamal El-SankaryEzz I. El-Masry
Published in: IEEE Trans. Circuits Syst. I Regul. Pap. (2015)
Keyphrases
  • nano scale
  • high speed
  • data sets
  • statistical analysis
  • higher order statistics
  • information retrieval