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Model-based process capability indices: The dry-etching semiconductor case study.

Riccardo BorgoniDiego Zappa
Published in: Qual. Reliab. Eng. Int. (2020)
Keyphrases
  • case study
  • neural network
  • optimal solution
  • social networks
  • image processing
  • image sequences
  • post processing
  • integrated circuit
  • magnetic recording