A novel correlative model of failure mechanisms for evaluating MEMS devices reliability.

Yaqiu Li Yufeng Sun Weiwei Hu Zili Wang

Published in: Microelectron. Reliab. (2016)

Keyphrases

formal model
management system
theoretical framework
mathematical model
high level
experimental data
data sets
information retrieval
search engine
probability distribution
computational model
statistical model
conceptual model