Fast circuit topology based method to configure the scan chains in Illinois Scan architecture.
Swapneel DonglikarMainak BangaMaheshwar ChandrasekarMichael S. HsiaoPublished in: ITC (2009)
Keyphrases
- high accuracy
- significant improvement
- high precision
- synthetic data
- detection method
- management system
- similarity measure
- objective function
- optimization method
- fully automatic
- experimental evaluation
- probabilistic model
- classification method
- image processing
- computationally efficient
- data sets
- software architecture
- reference model
- mathematical model
- real time
- input data
- support vector machine
- dynamic programming
- cost function
- prior knowledge
- feature extraction
- genetic algorithm