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Developer Micro Interaction Metrics for Software Defect Prediction.
Taek Lee
Jaechang Nam
DongGyun Han
Sunghun Kim
Hoh Peter In
Published in:
IEEE Trans. Software Eng. (2016)
Keyphrases
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software defect prediction
software defect
ensemble learning
imbalanced data
class imbalance
sample selection bias
feature ranking
data sets
neural network
learning algorithm
feature extraction
training data
least squares
machine learning algorithms
high dimensionality
concept drift