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Study of uniformly doped nano scale single-walled CNTFET under dark and illuminated conditions.

A. ArulmaryV. RajamaniT. Kavitha
Published in: Microelectron. J. (2020)
Keyphrases
  • nano scale
  • statistical analysis
  • real time
  • empirical studies
  • study proposes
  • feature selection
  • similarity measure