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Chip contour detection and recognition based on deep-learning approaches.

Bao Rong ChangHsiu Fen TsaiFu-Yang Chang
Published in: CCIOT (2023)
Keyphrases
  • deep learning
  • contour detection
  • machine learning
  • object recognition
  • unsupervised learning
  • pattern recognition
  • maximum likelihood
  • image segmentation
  • feature extraction