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Frequency analysis of atomic force microscopes with repulsive-attractive interaction potentials.

Donatello MaterassiMichele BassoRoberto Genesio
Published in: CDC (2004)
Keyphrases
  • frequency analysis
  • frequency domain
  • power spectrum
  • human computer interaction
  • high order
  • higher order
  • object detection
  • palmprint
  • high quality
  • pairwise
  • image data
  • principal component analysis
  • laser scanning