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A system-on-chip solution for deep learning-based automatic fetal biometric measurement.

Hyunwoo ChoDongju KimSunyeob ChangJinbum KangYangmo Yoo
Published in: Expert Syst. Appl. (2024)
Keyphrases
  • deep learning
  • unsupervised learning
  • machine learning
  • image processing
  • information retrieval
  • viewpoint
  • data sets
  • unsupervised feature learning
  • pattern recognition
  • natural language