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A system-on-chip solution for deep learning-based automatic fetal biometric measurement.
Hyunwoo Cho
Dongju Kim
Sunyeob Chang
Jinbum Kang
Yangmo Yoo
Published in:
Expert Syst. Appl. (2024)
Keyphrases
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deep learning
unsupervised learning
machine learning
image processing
information retrieval
viewpoint
data sets
unsupervised feature learning
pattern recognition
natural language