Login / Signup

Block-Wise Concatenated BCH Codes for NAND Flash Memories.

Sung-gun ChoDaesung KimJinho ChoiJeongseok Ha
Published in: IEEE Trans. Commun. (2014)
Keyphrases
  • block wise
  • reed solomon
  • error correction
  • order statistics
  • error control
  • flash memory
  • feature vectors
  • image quality
  • turbo codes