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A comprehensive production test solution for 1.5Gb/s and 3Gb/s serial-ATA - based on AWG and undersampling techniques.
Yi Cai
Amit Bhattacharyya
Joe Martone
Anant Verma
William Burchanowski
Published in:
ITC (2005)
Keyphrases
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high speed
data mining
closed form
class imbalance
real time
data sets
clustering algorithm
bayesian networks
optimal solution
evolutionary algorithm
control system
production system
solution quality