Program error rate-based wear leveling for NAND flash memory.
Xin ShiFei WuShunzhuo WangChangsheng XieZhonghai LuPublished in: DATE (2018)
Keyphrases
- error rate
- flash memory
- solid state
- garbage collection
- file system
- buffer management
- main memory
- disk drives
- embedded systems
- test set
- random access
- database systems
- data storage
- small size
- b tree
- storage devices
- storage systems
- lower error rates
- hand held devices
- misclassification rate
- equal error rate
- training data
- face recognition