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Gamma processes and peaks-over-threshold distributions for time-dependent reliability.
Jan M. van Noortwijk
Johannes A. M. van der Weide
Maarten-Jan Kallen
Mahesh D. Pandey
Published in:
Reliab. Eng. Syst. Saf. (2007)
Keyphrases
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stochastic processes
gamma distributions
probability distribution
hough transform
exponential distributions
information technology
gaussian distribution
threshold selection
databases
information systems
feature selection
em algorithm
change detection
computational models