Improving Machine Learning-Based Modeling of Semiconductor Devices by Data Self-Augmentation.
Zeheng WangLiang LiRoss C. C. LeonArne LauchtPublished in: CoRR (2021)
Keyphrases
- machine learning
- data analysis
- data sets
- data processing
- data structure
- data sources
- data quality
- database
- statistical methods
- statistical analysis
- data points
- training data
- end users
- knowledge discovery
- data collection
- decision trees
- missing data
- learning algorithm
- original data
- feature selection
- machine learning methods
- spatial data
- synthetic data
- high dimensional data
- data management
- text mining
- image data
- high quality
- probability distribution