A Large Scale Characterization of Device Uptimes.
Mateus Schulz NogueiraErica da Cunha FerreiraPedro Tubenchlak BoechatFelipe AssisEstevão Rabello UsslerRafael Rodrigo Furtado do NascimentoDaniel Sadoc MenaschéGeraldo XexéoAbhishek RamchandranKatinka WolterPublished in: IEEE Trans. Emerg. Top. Comput. (2023)