A Pattern Recognition Based Method for IC Failure Analysis.
Andrzej J. StrojwasStephen W. DirectorPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1985)
Keyphrases
- pattern recognition
- high accuracy
- computational cost
- image analysis
- dynamic programming
- computer vision
- pairwise
- optimization method
- high precision
- synthetic data
- main contribution
- theoretical analysis
- fuzzy sets
- feature set
- support vector machine
- experimental evaluation
- markov random field
- input data
- model selection
- statistical analysis
- clustering method
- detection method
- similarity measure
- machine learning