A Compact Model of Negative Bias Temperature Instability Suitable for Gate-Level Circuit Simulation.
Xu LiuAlessandro BernardiniUlf SchlichtmannXing ZhouPublished in: ISQED (2019)
Keyphrases
- mathematical model
- simulation model
- statistical model
- prior knowledge
- probabilistic model
- management system
- high speed
- neural network model
- high level
- agent model
- mathematical models
- computational model
- theoretical analysis
- cost function
- data sets
- experimental data
- conceptual model
- prediction model
- similarity measure
- circuit design
- qualitative simulation
- temperature field