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A General Reconstruction Framework for Deflectometric Measurement Based on Nonuniform B-Splines.

Wei LangXiangchao ZhangYunuo ChenTing ChenZhifei HuXiangqian Jiang
Published in: IEEE Trans. Instrum. Meas. (2023)
Keyphrases
  • b spline
  • special case
  • curve fitting
  • image processing
  • optical flow
  • high resolution
  • shape analysis
  • tensor product