A 45 nm Stacked CMOS Image Sensor Process Technology for Submicron Pixel.
Seiji TakahashiYi-Min HuangJhy-Jyi SzeTung-Ting WuFu-Sheng GuoWei-Cheng HsuTung-Hsiung TsengKing LiaoChin-Chia KuoTzu-Hsiang ChenWei-Chieh ChiangChun-Hao ChuangKeng-Yu ChouChi-Hsien ChungKuo-Yu ChouChien-Hsien TsengChuan-Joung WangDun-Nien YaungPublished in: Sensors (2017)