Yield Prediction With a New Generalized Process Capability Index Applicable to Non-Normal Data.
Stephan WeberTiago RessurreicaoCândido DuartePublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2016)
Keyphrases
- data sets
- data collection
- data mining
- synthetic data
- database
- data analysis
- redundant data
- small number
- statistical analysis
- data points
- training data
- correlation analysis
- data sources
- original data
- data distribution
- raw data
- normal operation
- historical data
- index structure
- data processing
- input data
- prior knowledge
- high quality