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Dependence of Resonance Characteristics on Thermal Annealing in ZnO-Based FBAR Devices.
Linh Mai
Mun-Hyuk Yim
Gi-Wan Yoon
Dong-Hyun Kim
Published in:
J. Inform. and Commun. Convergence Engineering (2004)
Keyphrases
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mobile devices
simulated annealing
data sets
thin film
data mining
genetic algorithm
computer vision
finite element analysis
electronic devices
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