Sampling Circuits That Break the kT/C Thermal Noise Limit.

Ron Kapusta Haiyang Zhu Colin Lyden

Published in: IEEE J. Solid State Circuits (2014)

Keyphrases

sampled data
noise level
infrared
missing data
sample size
noise reduction
random noise
sampling algorithm
noisy data
high speed
monte carlo
random sampling
additive noise
noise model
image noise
data sets
analog circuits
sampling strategy
estimation error
color images
multiscale