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Modelling SMD capacitors by measurements.

Roko MislovMarko MagerlSandra Fratte-SumperBernhard WeissChristian StockreiterAdrijan Baric
Published in: MIPRO (2016)
Keyphrases
  • conceptual modelling
  • special case
  • integrated circuit
  • sensor measurements
  • database systems
  • pairwise
  • measured data
  • optical properties