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Temperature- and aging-resistant inverter for robust and reliable time to digital circuit designs in a 65nm bulk CMOS process.

Konstantin TscherkaschinTheodor HillebrandMaike TaddikenSteffen PaulDagmar Peters-Drolshagen
Published in: IOLTS (2016)
Keyphrases
  • computationally efficient
  • highly accurate
  • robust estimation
  • image processing
  • parameter tuning
  • high speed
  • control algorithm
  • solar radiation