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On-chip weak resistive defect diagnosis with performance enhancement in 45 nm technology static random access memory.
Sheetal Barekar
Madan Mali
Published in:
Microelectron. J. (2021)
Keyphrases
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random access memory
nm technology
power consumption
design considerations
low power
low voltage
image processing
image enhancement
embedded dram
database
main memory
power dissipation
real time
data storage
flash memory
power management