Editorial: Special Issue on Probabilistic Models for Image Understanding.
Bill TriggsChristopher K. I. WilliamsPublished in: Int. J. Comput. Vis. (2010)
Keyphrases
- image understanding
- special issue
- probabilistic model
- graphical models
- image interpretation
- applied intelligence
- object recognition
- ecml pkdd
- ai edam
- computer vision
- image analysis
- international journal
- object detection
- bayesian networks
- special section
- expectation maximization
- image segmentation
- low level vision
- image processing
- conditional random fields
- image annotation
- control structure
- hidden variables
- artificial intelligence
- machine learning
- online learning