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Feature-to-Code Mapping in Two Large Product Lines.
Thorsten Berger
Steven She
Rafael Lotufo
Krzysztof Czarnecki
Andrzej Wasowski
Published in:
SPLC (2010)
Keyphrases
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product lines
product line
databases
feature vectors
source code
image features
general purpose
software development
real world
data mining
information systems
feature set
error rate