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TAIC-PART 2008 - Testing: Academic & Industrial conference - Practice and research techniques, special section editorial.

Leonardo BottaciGregory M. KapfhammerMarc Roper
Published in: Inf. Softw. Technol. (2010)
Keyphrases
  • special section
  • special issue
  • industrial applications
  • database
  • panel discussion
  • real world
  • data mining
  • information retrieval
  • artificial intelligence
  • international conference
  • selected papers